Zhongzhi semiconductor Temperature Test Chambers and High Temperature Aging Test Chambers feature a temperature range of -80°C to 500°C, temperature fluctuation of <±0.25°C, and heating to 150°C in only 20 minutes. They cover full-scenario HTOL and LTOL testing, equipped with an intelligent control system for real-time monitoring of 200+ operating variables, fully meeting international standards such as JEDEC and AEC-Q100.
Zhongzhi semiconductor Temperature Test Chambers and High Temperature Aging Test Chambers feature a temperature range of -80°C to 500°C, temperature fluctuation of <±0.25°C, and heating to 150°C in only 20 minutes. They cover full-scenario HTOL and LTOL testing, equipped with an intelligent control system for real-time monitoring of 200+ operating variables, fully meeting international standards such as JEDEC and AEC-Q100.
