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Highly Accelerated Stress Test Chamber

Highly Accelerated Stress Test Chamber is a testing equipment that rapidly evaluates the long-term reliability and moisture resistance of semiconductor chips by simulating extreme combined environments of high temperature, high humidity, and high pressure.

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Product Details

Model	HAST-25	HAST-35	HAST-45	HAST-55
Internal Dimensions (W×H×D) (mm)	300x250	350x450	450x550	550x650
External Dimensions (W×H×D) (mm)	850x1300x900	900x1350x900	1000x1480x1000	1150x1650x1200
Steam Temperature Range	100°C ~ 135°C (143°C is a special option)
Relative Pressure / Absolute Pressure	Relative Pressure: the value displayed on the pressure gauge; Absolute Pressure: the value displayed on the pressure gauge plus 1 atmospheric pressure (i.e., the actual value inside the test chamber)
Steam Humidity	70R.H ~ 100%R.H, adjustable
Operating Steam Pressure (Absolute Pressure)	0.0Kg/cm² ~ 2.0Kg/cm² (+101.3Kpa); (3Kg/cm² is a special specification)

Model	HAST-25	HAST-35	HAST-45	HAST-55
Internal Dimensions (W×H×D) (mm)	300x250	350x450	450x550	550x650
External Dimensions (W×H×D) (mm)	850x1300x900	900x1350x900	1000x1480x1000	1150x1650x1200
Steam Temperature Range	100°C ~ 135°C (143°C is a special option)
Relative Pressure / Absolute Pressure	Relative Pressure: the value displayed on the pressure gauge; Absolute Pressure: the value displayed on the pressure gauge plus 1 atmospheric pressure (i.e., the actual value inside the test chamber)
Steam Humidity	70R.H ~ 100%R.H, adjustable
Operating Steam Pressure (Absolute Pressure)	0.0Kg/cm² ~ 2.0Kg/cm² (+101.3Kpa); (3Kg/cm² is a special specification)